- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 30/02 - Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
Patent holdings for IPC class G01Q 30/02
Total number of patents in this class: 221
10-year publication summary
|
24
|
13
|
19
|
25
|
23
|
14
|
16
|
17
|
14
|
1
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Bruker Nano, Inc. | 334 |
15 |
| Fractilia, LLC | 23 |
14 |
| Carl Zeiss SMT GmbH | 2646 |
13 |
| The Regents of the University of California | 18943 |
7 |
| Centre National de La Recherche Scientifique | 9632 |
6 |
| Hitachi, Ltd. | 16452 |
5 |
| JPK Instruments AG | 22 |
4 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
3 |
| Olympus Corporation | 13667 |
3 |
| Cedars-Sinai Medical Center | 1088 |
3 |
| KLA-Tencor Corporation | 2574 |
3 |
| Korea Research Institute of Standards and Science | 639 |
3 |
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2362 |
3 |
| University of Notre Dame du Lac | 521 |
3 |
| Horiba France SAS | 57 |
3 |
| Gtheranostics Co., Ltd. | 6 |
3 |
| Ohba, Yusuke | 9 |
3 |
| Honda Motor Co., Ltd. | 24537 |
2 |
| Hitachi High-Tech Science Corporation | 326 |
2 |
| The Board of Trustees of the Leland Stanford Junior University | 6054 |
2 |
| Other owners | 121 |